ESD design challenges in state-of-the-art analog technologies

被引：6
|
作者：
Boselli, G. [1 ]
机构：
[1] Texas Instruments Inc, Analog ESD Lab, Dallas, TX 75243 USA
来源：
MICROELECTRONICS RELIABILITY | 2012年 / 52卷 / 9-10期
关键词：
PROTECTION; BREAKDOWN; SCR;
D O I：
10.1016/j.microrel.2012.06.141
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The relevance of Analog technologies has rapidly increased over recent years by virtue of the phenomenal success of portable consumer electronics (smart-phones, tablets, navigation devices etc.), which require a variety of analog functions to be integrated into the same device. From an ESD standpoint, the large components portfolio typical of state-of-the-art Analog technologies poses significant development challenges. This paper discusses these challenges. (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码：1769 / 1775
页数：7
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