Modelling an imperfect debugging phenomenon in software reliability

被引:25
|
作者
Kapur, PK [1 ]
Younes, S [1 ]
机构
[1] UNIV ALEPPO,FAC ELECT & ELECT ENGN,DEPT INFORMAT ENGN,ALEPPO,SYRIA
来源
MICROELECTRONICS AND RELIABILITY | 1996年 / 36卷 / 05期
关键词
D O I
10.1016/0026-2714(95)00157-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Several Software Reliability Growth Models (SRGMs) have been developed in the literature assuming the debugging process to be perfect and thus implying that there is one-to-one correspondence between the number of failures observed and errors removed. However, in reality it is possible that the error which is supposed to have been removed may cause a failure again. It may be due to the spawning of a new error because of imperfect debugging. If such a phenomenon exists then the Software Reliability Growth is S-shaped. In this paper, we develop a model which can describe imperfect debugging process and has the inbuilt flexibility of capturing a wide class of growth curves. Earlier attempts of modelling such a process were able to capture only a particular curve. In other words, if a failure observation phenomenon is exponential then the error removal is again modelled by an exponential growth curve. Applicability of the model has been shown on several data sets obtained from different software development projects.
引用
收藏
页码:645 / 650
页数:6
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