Preparing H4 Films and Their Laser Damage Resistance Deposited Using Ion-Beam-Assisted Electron Beam Evaporation

被引:1
|
作者
Li Xiaoxue [1 ]
Huang Lingcheng [2 ]
Hao Yongqin [1 ]
机构
[1] Changchun Univ Sci & Technol, State Key Lab High Power Semicond Laser, Changchun 130022, Jilin, Peoples R China
[2] Beijing Optoelect Technol Co Ltd, Beijing 100015, Peoples R China
关键词
films; ion-beam-assisted electron beam evaporation; LaTiO3 (H4); facet coating; refractive index;
D O I
10.3788/LOP202259.1931001
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
LaTiO3 (H4) films were prepared using ion-beam-assisted electron beam evaporation. The effect of substrate temperature, ion-beam density, high-temperature annealing, and plasma post-treatment on the optical properties and surface topography of the H4 films were tested. Results show that increasing the substrate temperature and ion-beam density appropriately can improve the refractive index and film quality. Under 175 degrees C substrate temperature and 120 mu A/cm(2) ion-beam density, the refractive index of the H4 films can reach 2.70. Moreover, annealing and plasma post-treatment can further improve the film quality. The optimized process parameters were used to prepare high reflection (HR) films with H4 for a 980-nm laser diode. The HR films with H4 exhibit the best laser damage resistance under 600 MW/cm(2) laser power density when compared with the HR films made with Ta2O5 or TiO2 as high-index materials.
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页数:6
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