The use of X-ray diffraction to determine slip and twinning activity in commercial-purity (CP) titanium

被引：37
|
作者：
Ungar, T. [1 ]
Glavicic, M. G. [2 ,3 ]
Balogh, L. [1 ]
Nyilas, K. [1 ]
Salem, A. A. [2 ,4 ]
Ribarik, G. [1 ]
Semiatin, S. L. [2 ]
机构：
[1] Eotvos Lorand Univ, Dept Mat Phys, H-1518 Budapest, Hungary
[2] AFRL MLLM, Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
[3] Universal Energy Syst Inc, Dayton, OH 45432 USA
[4] Universal Technol Corp, Dayton, OH 45432 USA
来源：
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2008年 / 493卷 / 1-2期
关键词：
titanium; slip activity; twinning; X-ray line profile analysis; dislocation density;
D O I：
10.1016/j.msea.2007.06.096
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
High-resolution X-ray diffraction (XRD) line-profile analysis was used to characterize slip activity and twinning in commercial-purity titanium (CP-Ti) during hot rolling. The effect of {10.1} and {10.2} twins on XRD patterns was deduced using the DIFFAX software. The density of twin boundaries was then incorporated into the XRD pattern-fitting procedure for evaluating dislocation densities, slip activity, and subgrain size. It was found that < a > and < c +a > type slip occurred during hot rolling. The X-ray data revealed 0.07(+/- 0.02)% twin-boundary frequency for the {10.2} twin family, but zero twinning (within the experimental accuracy) in the {10.1} family. Electron backscatter diffraction (EBSD) data confirmed the X-ray findings. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：79 / 85
页数：7
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