Disorder Induced Localized Photonic Modes In Planar Microcavities

被引：0
|
作者：
Kodriano, Y. [1 ]
Gershoni, D. [1 ]
Shapiro, B. [1 ]
Raikh, M. E. [2 ]
Reitzenstein, S. [3 ]
Reithmaier, J. P. [3 ]
Forchel, A. [3 ]
机构：
[1] Technion Israel Inst Technol, Dept Phys, IL-32000 Haifa, Israel
[2] Univ Utah, Dept Phys, Salt Lake City, UT 84112 USA
[3] Univ Wurzburg, Dept Phys, D-97070 Wurzburg, Germany
来源：
2008 CONFERENCE ON LASERS AND ELECTRO-OPTICS & QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE, VOLS 1-9 | 2008年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We detect localized modes in a planar microcavity containing a layer of quantum dots and measure their spatial intensity distribution. Theory based on disorder induced most probable fluctuation in the dielectric constant explains our findings. (C) 2008 Optical Society of America
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页码：3112 / +
页数：2
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