Structural, optical and electrical characterization of chemically deposited CdSe thin films

被引：46
|
作者：
Khomane, A. S. [1 ]
Hankare, P. P. [2 ]
机构：
[1] Rajaram Coll, Dept Chem, Kolhapur 416004, Maharashtra, India
[2] Shivaji Univ, Dept Chem, Kolhapur 416004, Maharashtra, India
来源：
JOURNAL OF ALLOYS AND COMPOUNDS | 2010年 / 489卷 / 02期
关键词：
Thin films; Crystal growth; Thermo-electric; X-ray diffraction; Optical spectroscopy; Scanning electron microscopy; TEMPERATURE; GROWTH;
D O I：
10.1016/j.jallcom.2009.09.122
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Cadmium selenide (CdSe) thin films have been deposited on glass substrate. CdSe thin films were characterized by various techniques such as X-ray diffraction, scanning electron microscopy and UV-vis-NIR double beam spectrophotometer. The electrical and thermo-electrical properties are also studied. The X-ray diffraction analysis shows that the film samples are in cubic crystal structure. The optical band gap energy (Eg) was found to be 1.7 eV. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码：605 / 608
页数：4
相关论文
共 50 条
  • [1] Structural and Optical Characterization of Chemically Deposited PbS Thin Films
    Fouda, A. N.
    Marzook, M.
    El-Khalek, H. M. Abd
    Ahmed, S.
    Eid, E. A.
    El Basaty, A. B.
    [J]. SILICON, 2017, 9 (06) : 809 - 816
  • [2] Structural and Optical Characterization of Chemically Deposited PbS Thin Films
    A. N. Fouda
    M. Marzook
    H. M. Abd El-Khalek
    S. Ahmed
    E. A. Eid
    A. B. El Basaty
    [J]. Silicon, 2017, 9 : 809 - 816
  • [3] Structural, optical and electrical properties of chemically deposited silver sulfide thin films
    Rodríguez, AN
    Nair, MTS
    Nair, PK
    [J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2005, 20 (06) : 576 - 585
  • [4] Chemically deposited copper oxide thin films: structural, optical and electrical characteristics
    Department of Solar Energy Materials, Ctro. Invest. Ener., Univ. Nac. A., Morelos, Mexico
    [J]. Appl Surf Sci, 1 (143-151):
  • [5] Chemically deposited copper oxide thin films: structural, optical and electrical characteristics
    Nair, MTS
    Guerrero, L
    Arenas, OL
    Nair, PK
    [J]. APPLIED SURFACE SCIENCE, 1999, 150 (1-4) : 143 - 151
  • [6] Optical and structural characterization of chemically deposited CuCrSnS4 thin films
    Alsulami, Abdullah
    Alsalme, Ali
    [J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2024, 35 (01)
  • [7] Optical and structural characterization of chemically deposited CuCrSnS4 thin films
    Abdullah Alsulami
    Ali Alsalme
    [J]. Journal of Materials Science: Materials in Electronics, 2024, 35
  • [8] Structural characterization of chemically deposited PbS thin films
    Fernandez-Lima, F. A.
    Gonzalez-Alfaro, Y.
    Larramendi, E. M.
    Fonseca Filho, H. D.
    Maia da Costa, M. E. H.
    Freire, F. L., Jr.
    Prioli, R.
    de Avillez, R. R.
    da Silveira, E. F.
    Calzadilla, O.
    de Melo, O.
    Pedrero, E.
    Hernandez, E.
    [J]. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2007, 136 (2-3): : 187 - 192
  • [9] Synthesis, structural, optical, electrical and thermoluminescence properties of chemically deposited PbS thin films
    Gode, F.
    Guneri, E.
    Emen, F. M.
    Kafadar, V. Emir
    Unlu, S.
    [J]. JOURNAL OF LUMINESCENCE, 2014, 147 : 41 - 48
  • [10] OPTICAL CHARACTERIZATION OF CHEMICALLY DEPOSITED SbCuS THIN FILMS
    Ekuma, Chinedu
    Nnabuchi, Mishack
    Aja, Nwabueze
    Owate, Israel
    [J]. ADVANCES IN MATERIALS SCIENCE FOR ENVIRONMENTAL AND NUCLEAR TECHNOLOGY, 2010, 222 : 243 - +
12345