Quantification of nitrogen impurity and estimated Orowan strengthening through secondary ion mass spectroscopy in aluminum cryomilled for extended durations

被引:16
|
作者
Hofmeister, Clara [1 ]
Klimov, Mikhail [1 ]
Deleghanty, Tim [2 ]
Cho, Kyu [3 ]
Sohn, Yongho [1 ]
机构
[1] Univ Cent Florida, Dept Mat Sci & Engn, Adv Mat Proc & Anal Ctr, Orlando, FL 32816 USA
[2] Pittsburgh Mat Technol, Jefferson Hills, PA 15025 USA
[3] US Army Res Lab, Weap & Mat Res Directorate, Aberdeen Proving Ground, MD 21005 USA
关键词
Aluminum alloy; Cryomilling; Nitrogen; Orowan strengthening; Secondary ion mass spectrometry; NANOSTRUCTURED MATERIALS;
D O I
10.1016/j.msea.2015.09.007
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The strength of aluminum alloys and composites processed through powder metallurgy can be improved through the addition of nano-scale dispersoids introduced during the cryomilling process. Quantification of Orowan strengthening from these dispersoids requires a reliable measurement of the impurity concentration. Secondary ion mass spectrometry (SIMS) was used to quantify the nitrogen impurity concentration using a N-14 ion implanted standard. An analytical approach is devised to determine the nitrogen concentration of an aluminum alloy and composite based on SIMS measurements. Results are compared to the measurements carried out by gas fusion analysis. An increase in nitrogen concentration was observed with an increase in cryomilling time up to 72 h. The nitrogen concentration varied from 1.64 +/- 0.17 at% (0.80 +/- 0.08 wt%) to 19.12 +/- 1.10 at% (13.17 +/- 0.71 wt%) for the 8 h and 72 h cryomilled nanocrystalline AA5083, respectively. Assuming that all nitrogen reacts to form dispersoids, the nitrogen concentration determined was used to calculate the volume and weight fractions of dispersoids, which in turn was used to estimate the strengthening contribution via Orowan strengthening. Orowan strengthening was calculated using dispersoids of 3, 9 and 15 nm. The range of Orowan strengthening contribution was estimated, in MPa, to be from 7.69 +/- 0.78 to 3.03 +/- 031 for the 8 h nanocrystalline AA5083 sample, and 154.97 +/- 10.29 to 61.09 +/- 4.06 for the 72 h nanocrystalline AA5083 sample. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:412 / 417
页数:6
相关论文
共 1 条