An Improvement Method for Efficiency and Stability of Circuit Fault Simulation

被引：0
|
作者：
Zhao, Guangyan [1 ]
Sun, Yufeng [1 ]
Hu, Weiwei [1 ]
Zhao, Gang [1 ]
机构：
[1] Beihang Univ, Sch Reliabil & Syst Engn, Beijing, Peoples R China
来源：
PROCEEDINGS OF THE 2013 INTERNATIONAL CONFERENCE ON ADVANCED ICT AND EDUCATION | 2013年 / 33卷
关键词：
circuit; fault simulation; functional reliability simulation; reliability;
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
The paper briefly introduces the method and principle of circuit fault simulation and circuit functional reliability simulation, describes the problems of such method in engineering application, analyzes the reasons for such problems in detail, and advances relevant improvement method and measures pertinent to different reasons. Finally comparative simulation analysis is made for a typical case by the improvement method to validate it and verify the engineering application value of the technique.
引用
收藏
页码：640 / 645
页数：6
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