Spectroscopic method for measuring refractive index

被引：3
|
作者：
Milosevic, Milan [1 ]
King, Sean W. [2 ]
机构：
[1] MeV Technol, Westport, CT 06880 USA
[2] Intel Corp, Log Technol Dev, Hillsboro, OR 97124 USA
来源：
APPLIED OPTICS | 2013年 / 52卷 / 19期
关键词：
GERMANIUM; DISPERSION; SILICON;
D O I：
10.1364/AO.52.004477
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A method for routine, but precise measurements of refractive index is described. The method is fast and accurate. It is based on the analysis of interference fringes, and uses positions of the fringe maxima and/or minima and a precise measurement of sample thickness to extract refractive index. An extremely dense dataset of refractive index values over the entire spectral range of interest can be routinely obtained. (C) 2013 Optical Society of America
引用
收藏
页码：4477 / 4482
页数：6
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