Quantitative analysis of CuIn1-xGaxSe2 thin film with fluctuation of operational parameters using laser-induced breakdown spectroscopy (vol 28, pg 890, 2013)

被引：0
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作者：
In, Jung-Hwan
Kim, Chan-Kyu
Lee, Seok-Hee
Shim, Hee-Sang
Jeong, Sungho
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JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 2013年 / 28卷 / 12期
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O65 [分析化学];
学科分类号：
070302 ; 081704 ;
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页码：1949 / 1949
页数：1
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  • [1] Quantitative analysis of CuIn1-xGaxSe2 thin films with fluctuation of operational parameters using laser-induced breakdown spectroscopy
    In, Jung-Hwan
    Kim, Chan-Kyu
    Lee, Seok-Hee
    Shim, Hee-Sang
    Jeong, Sungho
    [J]. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2013, 28 (06) : 890 - 900
  • [2] Comparison of thin-film and bulk CuIn1-xGaxSe2 samples by laser induced breakdown spectroscopy
    Kim, Chan K.
    Lee, Seok H.
    In, Jung H.
    Shim, Hee-S.
    Kim, Dong S.
    Jeong, Sungho
    [J]. THIN SOLID FILMS, 2013, 546 : 393 - 397
  • [3] Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1-xGaxSe2 thin film samples
    [J]. Jeong, Sungho (shjeong@gist.ac.kr), 1600, Royal Society of Chemistry (30):
  • [4] Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1-xGaxSe2 thin film samples
    In, Jung-Hwan
    Kim, Chan-Kyu
    Jeong, Sungho
    [J]. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2015, 30 (10) : 2107 - 2119
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    [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2013, 88 : 20 - 25
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    [J]. OPTICS EXPRESS, 2013, 21 (22): : A1018 - A1027
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