Finite Element Analysis of Ring-on-Ring Test on LCD Panels

被引：4
|
作者：
Vepakomma, K. Hemanth [1 ]
Westbrook, Jamie [1 ]
Carley, Stephen [1 ]
Kim, Jum [1 ]
机构：
[1] Corning Inc, Corning, NY 14831 USA
来源：
JOURNAL OF DISPLAY TECHNOLOGY | 2013年 / 9卷 / 08期
关键词：
Finite element analysis; LCD panel; ring-on-ring (ROR) test; ROR; surface strength testing; thin glass; GLASS UNITS; STRENGTH; THIN; BALL; DISCS;
D O I：
10.1109/JDT.2013.2251744
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The ring-on-ring test is one of the most popular surface strength testing methods used to test LCD panels. This paper uses finite element analysis to show that a panel behaves like two independent pieces of glass during a ring-on-ring test. The epoxy region where the color filter and thin-film transistor (TFT) glasses are glued together does not affect the stress at the center. As LCD panels get thinner, the contribution of membrane stress increases significantly. Because the color filter and TFT glasses act independently, they experience maximum principal stresses within 15% of each other. For deflections greater than one-half (sometimes one-fourth) the glass thickness, the stresses are not uniform inside the load ring, requiring finite element analysis to obtain an accurate stress distribution.
引用
收藏
页码：673 / 677
页数：5
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