A Digital Method for Phase Noise Measurement

被引：0
|
作者：
Ecker, Allan [1 ]
Blakkan, Ken [1 ]
Soma, Mani [1 ]
机构：
[1] Univ Washington, Seattle, WA 98195 USA
来源：
PROCEEDINGS INTERNATIONAL TEST CONFERENCE 2012 | 2012年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
To reduce the test costs of phase noise measurements, we use all-digital methods to detect sinusoidal phase noise components while reducing the need for computation intensive FFT.
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页数：10
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