Stability of an oscillating tip in noncontact atomic force microscopy:: Theoretical and numerical investigations

被引:11
|
作者
Couturier, G [1 ]
Nony, L [1 ]
Boisgard, R [1 ]
Aimé, JP [1 ]
机构
[1] Univ Bordeaux 1, Ctr Phys Mol Opt & Hertzienne, CNRS, UMR 5798, F-33405 Talence, France
关键词
D O I
10.1063/1.1428084
中图分类号
O59 [应用物理学];
学科分类号
摘要
This article is a theoretical and a numerical investigation of the stability of a tip-cantilever system used in noncontact atomic force microscopy (NC-AFM) when it oscillates close to a surface. No additional dissipative force is considered. The theoretical approach is based on a variational method exploiting a coarse grained operation that gives the temporal dependence of the nonlinear coupled equations of motion in amplitude and phase of the oscillator. Stability criterions for the resonance peak are deduced and predict a stable behavior of the oscillator in the vicinity of the resonance. The numerical approach is based on results obtained with a virtual NC-AFM developed in our group. The effect of the size of the stable domain in phase is investigated. These results are in particularly good agreement with the theoretical predictions. They also show the influence of the phase shifter in the feedback loop and the way in which it can affect the damping signal. (C) 2002 American Institute of Physics.
引用
收藏
页码:2537 / 2543
页数:7
相关论文
共 50 条
  • [1] Theoretical simulation of noncontact atomic force microscopy in liquids
    Tsukada, M.
    Watanabe, N.
    Harada, M.
    Tagami, K.
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (03):
  • [2] Surface structure investigations using noncontact atomic force microscopy
    Kolodziej, J. J.
    Such, B.
    Goryl, M.
    Krok, F.
    Piatkowski, P.
    Szymonski, M.
    [J]. APPLIED SURFACE SCIENCE, 2006, 252 (21) : 7614 - 7623
  • [3] Development of a metal-tip cantilever for noncontact atomic force microscopy
    Akiyama, K
    Eguchi, T
    An, T
    Fujikawa, Y
    Yamada-Takamura, Y
    Sakurai, T
    Hasegawa, Y
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (03):
  • [4] Noncontact atomic force microscopy
    Schwarz, Udo D.
    [J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2012, 3 : 172 - 173
  • [5] Self-oscillating mode for frequency modulation noncontact atomic force microscopy
    Giessibl, FJ
    Tortonese, M
    [J]. APPLIED PHYSICS LETTERS, 1997, 70 (19) : 2529 - 2531
  • [6] Tip-surface interactions in noncontact atomic force microscopy on reactive surfaces
    Stich, I
    Tóbik, J
    Pérez, R
    Terakura, K
    Ke, SH
    [J]. PROGRESS IN SURFACE SCIENCE, 2000, 64 (3-8) : 179 - 191
  • [7] Noncontact atomic force microscopy III
    Baykara, Mehmet Z.
    Schwarz, Udo D.
    [J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2016, 7 : 946 - 947
  • [8] Noncontact atomic force microscopy II
    Baykara, Mehmet Z.
    Schwarz, Udo D.
    [J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2014, 5 : 289 - 290
  • [9] Simulated noncontact atomic force microscopy images of Si(001) surface with silicon tip
    Tagami, Katsunori
    Tsukada, Masaru
    [J]. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2000, 39 (10): : 6025 - 6028
  • [10] Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor
    Stirling, Julian
    Shaw, Gordon A.
    [J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2013, 4 : 10 - 19