Optical Properties of Lead-Free NKN Films from Transmission and Spectral Ellipsometry

被引:1
|
作者
Schwarz, R. [1 ,2 ]
Santos, L. [2 ,3 ]
Ayouchi, R. [1 ,2 ]
Bhattacharyya, S. R. [1 ,2 ]
Mardolcar, U. [4 ,5 ]
Leal, M. [1 ,2 ]
Kholkin, A. [6 ,7 ]
机构
[1] Inst Super Tecn, Dept Phys, Lisbon, Portugal
[2] Inst Super Tecn, ICEMS, Lisbon, Portugal
[3] Inst Super Tecn, Dept Chem Engn, Lisbon, Portugal
[4] IST, Dept Phys, Lisbon, Portugal
[5] FCUL, Ctr Mol Sci & Mat, Lisbon, Portugal
[6] Univ Aveiro, DECV, P-3800 Aveiro, Portugal
[7] Univ Aveiro, CICECO, P-3800 Aveiro, Portugal
关键词
Band gap; optical transmission; spectral ellipsometry; NKN; thin film; PLD; THIN-FILMS;
D O I
10.1080/00150193.2013.821018
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin films of lead-free NaxK1-xNbO3 (NKN) were prepared by pulsed laser deposition (PLD) from ceramic targets of stoichiometric NKN or doped with 6% of lithium niobate (LN). At a deposition temperature of 600 degrees C a strong dependence of film morphology on laser fluence is revealed by SEM microscopy. Optical properties like band gap and index of refraction were obtained through transmission measurements and analysis based on the Tauc model. The results were compared to spectral ellipsometry using a fit to the Tauc-Lorentz model, and slightly smaller band gap values were obtained. C-V characteristics of sandwich structures yielded high permittivity of 380 in pure NKN films and tunability at 1kHz of 3.2% at 1.5 MV/m applied electric field.
引用
收藏
页码:118 / 127
页数:10
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