Initial tests of the dual-sweep streak camera system planned for APS particle-beam diagnostics

被引：0
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作者：
Lumpkin, A [1 ]
Yang, B [1 ]
Gai, W [1 ]
Cieslik, W [1 ]
机构：
[1] ARGONNE NATL LAB,ARGONNE,IL 60439
来源：
PROCEEDINGS OF THE 1995 PARTICLE ACCELERATOR CONFERENCE, VOLS 1-5 | 1996年
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：2476 / 2478
页数：3
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