Anisotropic Etching of Atomically Thin MoS2

被引:181
|
作者
Yamamoto, Mahito [1 ,2 ]
Einstein, Theodore L. [1 ,2 ]
Fuhrer, Michael S. [1 ,2 ,3 ]
Cullen, William G. [1 ,2 ]
机构
[1] Univ Maryland, Mat Res Sci & Engn Ctr, College Pk, MD 20742 USA
[2] Univ Maryland, Dept Phys, Ctr Nanophys & Adv Mat, College Pk, MD 20742 USA
[3] Monash Univ, Sch Phys, Clayton, Vic 3800, Australia
来源
JOURNAL OF PHYSICAL CHEMISTRY C | 2013年 / 117卷 / 48期
基金
澳大利亚研究理事会; 美国国家科学基金会;
关键词
ACTIVE EDGE SITES; RAMAN-SPECTRUM; GRAPHENE; OXIDATION; IDENTIFICATION; REACTIVITY; NANOSHEETS; CHEMISTRY;
D O I
10.1021/jp410893e
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Exposure to oxygen at 300-340 degrees C results in triangular etch pits with uniform orientation on the surfaces of atomically thin molybdenum disulfide (MoS2), indicating anisotropic etching terminating on lattice planes. The triangular pits grow laterally with oxidation time. The density of pits scarcely depends on oxidation time, temperature, and MoS2 thickness but varies significantly from sample to sample, indicating that etching is initiated at native defect sites on the basal plane surface rather than activated by substrate effects such as charged impurities or surface roughness. Raman spectroscopy confirms that oxygen treatment produces no molybdenum oxide (MoO3) below 340 degrees C. However, upon oxidation above 200 degrees C, the Raman A(1g) mode upshifts and the linewidth decreases, indicating p-type doping of MoS2. Oxidation at 400 degrees C results in complete conversion to MoO3.
引用
收藏
页码:25643 / 25649
页数:7
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