Stability of liquid crystal alignment to the electric field

被引：0

作者：

Oh, Yumi ^{[1
]}

Im, Ji-Young ^{[1
]}

Lee, Eun-Kyu ^{[1
]}

Kim, Jong-Hyun ^{[1
]}

机构：

[1] Chungnam Natl Univ, Taejon, South Korea

来源：

IMID/IDMC 2006: THE 6TH INTERNATIONAL MEETING ON INFORMATION DISPLAY/THE 5TH INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE, DIGEST OF TECHNICAL PAPERS | 2006年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We observed the destruction of the liquid crystal alignment with the repeating scan of strong DC electric field. The strong electric field seems to force the alignment to be scarred permanently and it accumulated with the repetition. In this report we connected alignment destruction behavior and electric field strength to obtain information on the alignment strength. And we compared the behavior between different alignment techniques.

引用

页码：834 / 837

页数：4

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