Valid t-Ratio Inference for IVt

被引:105
|
作者
Lee, David s. [1 ,2 ]
Mccrary, Justin [2 ,3 ]
Moreira, Marcelo j. [4 ]
Porter, Jack [5 ]
机构
[1] Princeton Univ, Princeton, NJ 08544 USA
[2] NBER, Cambridge, MA 02138 USA
[3] Columbia Univ, New York, NY USA
[4] FGV EPGE, Rio De Janeiro, Brazil
[5] Univ Wisconsin, Madison, WI USA
来源
AMERICAN ECONOMIC REVIEW | 2022年 / 112卷 / 10期
关键词
INSTRUMENTAL VARIABLES REGRESSION; WEAK INSTRUMENTS; TESTS;
D O I
10.1257/aer.20211063
中图分类号
F [经济];
学科分类号
02 ;
摘要
In the single-IV model, researchers commonly rely on t-ratio-based inference, even though the literature has quantified its potentially severe large-sample distortions. Building on Stock and Yogo (2005), we introduce the tF critical value function, leading to a stan-dard error adjustment that is a smooth function of the first-stage F-statistic. For one-quarter of specifications in 61 AER papers, cor-rected standard errors are at least 49 and 136 percent larger than conventional 2SLS standard errors at the 5 percent and 1 percent significance levels, respectively. tF confidence intervals have shorter expected length than those of Anderson and Rubin (1949), whenever both are bounded. (JEL C13, C26)
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页码:3260 / 3290
页数:31
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