Development of smart diagnostic algorithm for 800kV gas insulated switchgear

被引：0
|
作者：
Kim, JB [1 ]
Kim, MS [1 ]
Kim, TW [1 ]
Youn, SH [1 ]
Song, WP [1 ]
Park, WZ [1 ]
机构：
[1] Hyosung Corp, Chang Won 641712, South Korea
来源：
ICSD '01: PROCEEDINGS OF THE 2001 IEEE 7TH INTERNATIONAL CONFERENCE ON SOLID DIELECTRICS | 2001年
关键词：
D O I：
10.1109/ICSD.2001.955653
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：351 / 354
页数：4
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