A nanofabrication scheme for InAs/AlSb heterostructures

被引:19
|
作者
Yang, MJ [1 ]
Cheng, KA
Yang, CH
Culbertson, JC
机构
[1] USN, Res Lab, Washington, DC 20375 USA
[2] Univ Maryland, Dept Elect & Comp Engn, College Pk, MD 20742 USA
[3] Univ Maryland, Lab Phys Sci, College Pk, MD 20742 USA
关键词
D O I
10.1063/1.1449526
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report a technique for nanofabrication in the InAs/GaSb/AlSb 6.1 Angstrom material system that utilizes the large difference in the surface Fermi level pinning position for InAs [E-f(s)(InAs)] compared with that for AlSb. An InAs/AlSb single quantum well is capped with a 3 nm, intentionally p-doped InAs layer. As a result of its construction and a relatively low E-f(s)(InAs) there are no free carriers in the InAs/AlSb single quantum well making the quantum well insulating as-grown. Simply by selectively removing the thin p-doped InAs cap layer with a wet etch, the surface Fermi level becomes pinned on AlSb and shifted upward by half an electron volt. This results in a drastic change in band bending and creates a conducting electron channel in the buried InAs quantum well. We demonstrate with experiment and the support of a self-consistent band bending calculation that this scheme is highly effective for nanofabrication. (C) 2002 American Institute of Physics.
引用
收藏
页码:1201 / 1203
页数:3
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