Resolution enhanced photothermal imaging by high-order correlation

被引:4
|
作者
Sunian, Xiaobing [1 ,2 ]
Liu, Wei [3 ]
Chen, Lei [3 ]
Zhou, Zhihao [1 ,2 ]
Shen, Dongyi [3 ]
Liu, Yuehan [4 ]
Wan, Wenjie [1 ,2 ,3 ]
机构
[1] Shanghai Jiao Tong Univ, Univ Michigan Shanghai Jiao Tong Univ Joint Inst, MOE Key Lab Laser Plasmas, Shanghai 200240, Peoples R China
[2] Shanghai Jiao Tong Univ, Univ Michigan Shanghai Jiao Tong Univ Joint Inst, Collaborat Innovat Ctr IFSA, Shanghai 200240, Peoples R China
[3] Shanghai Jiao Tong Univ, Dept Phys & Astron, State Key Lab Adv Opt Commun Syst & Networks, Shanghai 200240, Peoples R China
[4] Johns Hopkins Univ, Whiting Sch Engn, Baltimore, MD 21218 USA
基金
中国国家自然科学基金;
关键词
SPATIAL-RESOLUTION; MICROSCOPY; DEFINITION; EMISSION; CONTRAST; LIMIT;
D O I
10.1364/OL.396780
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Laser scanning photothermal imaging offers a powerful non-destructive testing tool to visualize subsurface structures of opaque materials, but it suffers the resolution limit imposed by thermal diffusion. To overcome this physical obstacle, a tightly focused excitation beam with a high repetition rate is usually used to improve the spatial resolution. Here, we demonstrate that the resolution of photothermal imaging could be enhanced using the high-order correlation imaging method inspired by correlated optical imaging. By carefully designing the laser scanning and modulation behavior, we can individually control the statistical properties of isolated hotspots induced by lasers. Imaging reconstructions of subsurface structures are performed afterward by reading out time-fluctuated thermal images. Moreover, the resolution can be further enhanced by using the high-order correlation, which enables a new way for highly resolved thermal imaging and metrology applications. (C) 2020 Optical Society of America
引用
收藏
页码:5696 / 5699
页数:4
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