LOW TEMPERATURE ADHESIVE WAFER BONDING USING OSTE(+) FOR HETEROGENEOUS 3D MEMS INTEGRATION

被引:0
|
作者
Forsberg, Fredrik [1 ]
Saharil, Farizah [1 ]
Stemme, Goran [1 ]
Roxhed, Niclas [1 ]
van der Wijngaart, Wouter [1 ]
Haraldsson, Tommy [1 ]
Niklaus, Frank [1 ]
机构
[1] KTH Royal Inst Technol, Microsyst Technol Lab, Sch Elect Engn, Stockholm, Sweden
基金
欧洲研究理事会;
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrate, for the first time, the use of off stoichiometry thiolene-epoxy, OSTE(+) for adhesive wafer bonding. The dual cure system, with an initial UV-curing step followed by a second thermal cure, allows for high bond strength and potentially high quality material interfaces. We show that cured OSTE(+) is easily removed in oxygen plasma and that the characteristics of OSTE(+) make it a potential candidate for use in heterogeneous 3D MEMS integration. Furthermore, we show how the bond energies of wafers bonded with OSTE(+) adhesive compares with the bond energies of wafers bonded with Cyclotene 3022-46 (BCB) and mr-I 9150XP nanoimprint resist.
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页码:343 / 346
页数:4
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