The analysis of the effect of flicker noise on orthogonal frequency-division multiplexing systems

被引:0
|
作者
Woo, Sanghyun [1 ]
Hur, Joonhoi [2 ]
Kim, Hyoungsoo [3 ]
机构
[1] Qualcomm, San Diego, CA USA
[2] Texas Instruments Inc, Richardson, TX USA
[3] Univ N Texas, Dept Elect Engn, Denton, TX 76203 USA
关键词
flicker noise; orthogonal frequency-division multiplexing; Reed Solomon codes; PHASE NOISE; OFDM SYSTEMS; MITIGATION;
D O I
10.1002/mop.27502
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this article, we proposed a new flicker noise simulation methodology within an orthogonal frequency-division multiplexing (OFDM) PHY layer, which offers accurate analyses of the flicker noise effect.To prove this effect, we examine bit error rate performance with flicker noise by generating raw and channel-coded data. Experiment results are demonstrated using Reed Solomon channel coding. The proposed simulation methodology offers precise results for deciding flicker noise requirement on RF building blocks for OFDM systems. (c) 2013 Wiley Periodicals, Inc. Microwave Opt Technol Lett 55:11711174, 2013; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.27502
引用
收藏
页码:1171 / 1174
页数:4
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