SEFI Cross-section Evaluation by Fault Injection Software Approach and Hardware Detection

被引：0
|
作者：
Loskutov, I. O. [1 ]
Nekrasov, P. V. [2 ]
Shilovskiy, I. I. Shvetsov [2 ]
Boychenko, D. V. [2 ]
Uzhegov, V. M. [3 ]
机构：
[1] Natl Res Nucl Univ MEPhI, Moscow Engn Phys Inst, Moscow, Russia
[2] Natl Res Nucl Univ MEPhI, Moscow, Russia
[3] TSNIIMASH, Korolev, Russia
来源：
2017 IEEE 30TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL) | 2017年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents the system that allows SEFI modelling by means of injecting upsets in different microcontroller memory blocks, carrying out its functional control and detect the moment when SEFI occurs. Test setup was developed on the basis of National Instruments PXI modular equipment and LabVILW software. Developed fault injection system was tested on PIC17 microcontroller. The comparison between simulation results and ground tests is presented.
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页码：251 / 254
页数：4
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