共 3 条
Shunt resistance and saturation current determination in CdTe and CIGS solar cells. Part 2: application to experimental IV measurements and comparison with other methods
被引:10
|作者:
Rangel-Kuoppa, Victor-Tapio
[1
]
Albor-Aguilera, Maria-de-Lourdes
[1
]
Hernandez-Vasquez, Cesar
[1
]
Flores-Marquez, Jose-Manuel
[2
]
Jimenez-Olarte, Daniel
[3
]
Sastre-Hernandez, Jorge
[4
]
Gonzalez-Trujillo, Miguel-Angel
[5
]
Contreras-Puente, Gerardo-Silverio
[1
]
机构:
[1] Inst Politecn Nacl, ESFM, Dept Fis, UPALM, San Pedro Zacatenco 07738, Cdmx, Mexico
[2] Inst Politecn Nacl, ESIQIE, Dept Ingn Met & Mat, UPALM, San Pedro Zacatenco 07738, Cdmx, Mexico
[3] Inst Politecn Nacl, ESIME, Secc Estudios Posgrad & Invest, UPALM, San Pedro Zacatenco 07738, Cdmx, Mexico
[4] Tecnol Monterrey, Escuela Ingn & Ciencias, Av Carlos Lazo 100, Mexico City 01389, DF, Mexico
[5] Inst Politecn Nacl, ESCOM, Dept Formac Basica, San Pedro Zacatenco 07738, Cdmx, Mexico
关键词:
CdTe;
CIGS;
CdS;
parameter extraction;
saturation current;
shunt resistance;
Solar cell;
PARAMETERS;
D O I:
10.1088/1361-6641/aab018
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
In this Part 2 of this series of articles, the procedure proposed in Part 1, namely a new parameter extraction technique of the shunt resistance (R-sh) and saturation current (I-sat) of a current-voltage (I-V) measurement of a solar cell, within the one-diode model, is applied to CdS-CdTe and CIGS-CdS solar cells. First, the Cheung method is used to obtain the series resistance (R-s) and the ideality factor n. Afterwards, procedures A and B proposed in Part 1 are used to obtain R-sh and I-sat. The procedure is compared with two other commonly used procedures. Better accuracy on the simulated I-V curves used with the parameters extracted by our method is obtained. Also, the integral percentage errors from the simulated I-V curves using the method proposed in this study are one order of magnitude smaller compared with the integral percentage errors using the other two methods.
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页数:12
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