Hall sensor arrays for rapid large-area transient eddy current inspection

被引:14
|
作者
Smith, RA [1 ]
Harrison, DJ [1 ]
机构
[1] QinetiQ Ltd, Future Syst Technol Div, Farnborough GU14 0LX, Hants, England
关键词
D O I
10.1784/insi.46.3.142.55523
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
There is an ongoing requirement for scanning large areas of metallic structures to detect and characterise small defects. This has led to the development of a new type of eddy current probe that incorporates a sparse linear array of Hall sensors. This probe has been evaluated with the TRECSCAN((R)) system using transient excitation. It is shown that coherent images of defects can be formed with notable reductions in inspection time. Although the inherent resolution of the probe is not high, it can rapidly scan large areas that are relatively featureless. When a feature requires more detail, repeated over-scanning produces an image with as much resolution as required.
引用
收藏
页码:142 / 146
页数:5
相关论文
共 50 条
  • [1] EDDY CURRENT SENSOR ARRAYS FOR PIPELINE INSPECTION WITH AND WITHOUT COATINGS
    Washabaugh, Andrew
    Haque, Shayan
    Jablonski, David
    Goldfine, Neil J.
    [J]. PROCEEDINGS OF THE ASME INTERNATIONAL PIPELINE CONFERENCE 2010, VOL 1, 2010, : 539 - 548
  • [2] Eddy current arrays for wheel inspection
    Leclerc, R
    [J]. REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 20A AND 20B, 2001, 557 : 949 - 952
  • [3] Image correction and fusion for large-area CCD sensor arrays
    Qi, HR
    Snyder, WE
    [J]. PROCEEDINGS OF THE 7TH JOINT CONFERENCE ON INFORMATION SCIENCES, 2003, : 756 - 759
  • [4] On the use of organic transistors in flexible large-area sensor arrays
    Cobb, Brian
    Kumar, Abhishek
    [J]. ORGANIC FIELD-EFFECT TRANSISTORS XIV; AND ORGANIC SENSORS AND BIOELECTRONICS VIII, 2015, 9568
  • [5] Noise Analysis of Image Sensor Arrays for Large-Area Biomedical Imaging
    Lai, Jackson
    Striakhilev, Denis
    Vygranenko, Yuri
    Heiler, Gregory
    Nathan, Arokia
    Tredwell, Timothy
    [J]. AMORPHOUS AND POLYCRYSTALLINE THIN-FILM SILICON SCIENCE AND TECHNOLOGY-2008, 2008, 1066 : 413 - +
  • [6] Raman Imaging for Large-Area Wafer Inspection
    不详
    [J]. SPECTROSCOPY, 2024, 39 (02) : 41 - 41
  • [7] Development and Application of Eddy Current Sensor Arrays for Process Integrated Inspection of Carbon Fibre Preforms
    Berger, Dietrich
    Lanza, Gisela
    [J]. SENSORS, 2018, 18 (01):
  • [8] Large-area graphene for sensor applications
    Snow, Eric S.
    [J]. MICRO- AND NANOTECHNOLOGY SENSORS, SYSTEMS, AND APPLICATIONS II, 2010, 7679
  • [9] Nanoantenna Arrays for Large-Area Emission Enhancement
    Pellegrini, Giovanni
    Mattei, Giovanni
    Mazzoldi, Paolo
    [J]. JOURNAL OF PHYSICAL CHEMISTRY C, 2011, 115 (50): : 24662 - 24665
  • [10] Large-area APDs and monolithic APD Arrays
    Shah, KS
    Farrell, R
    Grazioso, R
    Myers, R
    Cirignano, L
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2001, 48 (06) : 2352 - 2356