Measurement of the van der Waals force using reflection of cold atoms from magnetic thin-film atom mirrors

被引:29
|
作者
Mohapatra, AK [1 ]
Unnikrishnan, CS [1 ]
机构
[1] Tata Inst Fundamental Res, Fundamental Interact Lab, Gravitat Grp, Bombay 400005, Maharashtra, India
来源
EUROPHYSICS LETTERS | 2006年 / 73卷 / 06期
关键词
D O I
10.1209/epl/i2005-10477-3
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We report on a measurement of the van der Waals interaction between rubidium atoms in the ground state and a metallic surface, employing a new method involving reflection of laser-cooled atoms from magnetic thin-film atom mirrors. We made use of the fact that the typical distance from which atoms reflect from thin-film magnetic mirrors is of the order of the magnetic domain size and the thickness of the thin film. The modification of the reflectivity of cold atoms from cobalt thin-film magnetic mirrors, with thickness in the range of 200-20nm, due to the competition between the attractive atom-surface interaction and the repulsive magnetic interaction enabled the measurement of the van der Waals force in the range 20-50nm with an uncertainty of 15%. The measured value agrees well with recent theoretical estimates.
引用
收藏
页码:839 / 845
页数:7
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