Microstructure and optical properties of In2S3 films produced by thermal evaporation

被引：9
|
作者：
Goncharova, O. V. [1 ]
Gremenok, V. F. [2 ]
机构：
[1] Belarussian Acad Sci, BI Stepanov Phys Inst, Minsk 220072, BELARUS
[2] Belarussian Acad Sci, State Sci Prod Assoc, Sci & Pract Mat Res Ctr, Minsk 220072, BELARUS
来源：
SEMICONDUCTORS | 2009年 / 43卷 / 01期
关键词：
THIN-FILMS; SOLAR-CELLS; IN2O3; GROWTH;
D O I：
10.1134/S1063782609010199
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The data on the influence of the microstructure of In2S3 films produced by thermal evaporation upon their optical properties in relation to the film's thickness are reported. The atomic force spectroscopy data for the layers that are produced in identical technological conditions, but exhibit different spectral positions of the optical absorption edge are presented and discussed. Variations in the optical band gap from 2.0 to 3.6 eV under variations in the thickness of the In2S3 films from 800-450 nm to 50-30 nm are observed. The variations are interpreted as a result of variations in the content of grains, specific in dimensions and microstructure.
引用
收藏
页码：96 / 101
页数：6
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