A Generalized Model-based Test Generation Method

被引：9
|
作者：
Bonifacio, Adilson Luiz [1 ]
Moura, Arnaldo Vieira [1 ]
Simao, Adenilso da Silva [2 ]
机构：
[1] Univ Estadual Campinas, Comp Inst, PO 6176, BR-13081970 Campinas, SP, Brazil
[2] Univ Sao Paulo, Math Sci & Comp Inst, BR-13560 Sao Carlos, Brazil
来源：
SEFM 2008: SIXTH IEEE INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING AND FORMAL METHODS, PROCEEDINGS | 2008年
关键词：
D O I：
10.1109/SEFM.2008.17
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
In this paper we present a generalization to the W-method [3], which can be used for automatically generating test cases. In. contrast to the W-method, this generalization allows for test case generation even in the absence of characterization sets for the specification. We give proofs of correctness for this generalization, and show how to derive the original W-method from. it as a particular case. Proofs of correctness for the W-method, not given in the original paper, are also presented in a clear and detailed ways
引用
收藏
页码：139 / +
页数：2
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