Illumination Aspects of Sparse Line Arrays for 3D Terahertz Imaging

被引:0
|
作者
Baccouche, B. [1 ]
Mohammadzadeh, S. [1 ]
Keil, A. [2 ]
Kahl, M. [3 ]
Bolivar, P. Haring [3 ]
Loeffler, T. [4 ]
Jonuscheit, J. [1 ]
Sauer-Greff, W. [5 ]
Urbansky, R. [5 ]
Friederich, F. [1 ]
机构
[1] Fraunhofer Inst Phys Measurement Tech, D-67663 Kaiserslautern, Germany
[2] Becker Photon GmbH, D-32457 Porta Westfalica, Germany
[3] Univ Siegen, Inst High Frequency & Quantum Elect, D-57076 Siegen, Germany
[4] Synview GmbH, D-61348 Bad Homburg, Germany
[5] Kaiserslautern Univ Technol, Inst Commun Engn, D-67663 Kaiserslautern, Germany
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Terahertz imaging solutions for industrial non-destructive testing applications receive an increasing attention. Besides the need for real-time acquisition and image processing, 3D feature localization and large field of views of several tenths to a few meters are in the focus of interest. For this purposes sparse line arrays of transmitters (Tx) and receivers (Rx) offer an optimal approach to reduce costs, hardware complexity and potentially the required measurement time of the system, while providing a comparable imaging quality to full array based approaches. But in the presence of dominant specular reflections, sparse arrays can lead to an inhomogeneous illumination which impairs images and hampers their correct interpretation. We propose an experimentally verified method to simulative asses the design of sparse line arrays, taking in consideration the scattering characteristics of the object under test.
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