Pattern guided structure formation in polymer films of asymmetric blends

被引:9
|
作者
Raczkowska, J
Bernasik, A
Budkowski, A
Cyganik, P
Rysz, J
Raptis, I
Czuba, P
机构
[1] Jagiellonian Univ, M Smoluchowski Inst Phys, PL-30059 Krakow, Poland
[2] AGH Univ Sci & Technol, Fac Phys & Appl Comp Sci, PL-30059 Krakow, Poland
[3] Jagiellonian Univ, Joint Ctr Chem Anal & Struct Res, PL-30059 Krakow, Poland
[4] NCRS Demokritos, Inst Microelect, Aghia Paraskevi 15310, Greece
关键词
atomic force microscopy; soft-lithography; pattern replication; self-assembly; polymer films; thin film structures;
D O I
10.1016/j.susc.2005.12.033
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Two off-critical blends of poly(2-vinylpyridine) and polystyrene, 2:3 and 3:2 (w:w) PVP:PS, were spin-cast (with varied domain scale R) onto periodically (lambda = 4 mu m) patterned substrate. The pattern consisted of two alternating symmetric stripes: Au attracting PVP and neutral self-assembled monolayer. The resulting droplet-type morphologies were recorded with Scanning Force Microscopy and examined with integral geometry approach. PVP-rich islands of the 2:3 PVP:PS films form, for a wide R/lambda range, strongly anisotropic morphologies. They show up, for R/lambda similar to 0.5, a weak lambda/2-substructure of smaller PVP droplets in addition to the domains periodic with lambda. The 3:2 blend exhibits morphologies with dominant lambda-structure of PVP ribbons, which encircle PS droplets. For R/lambda similar to 0.5, smaller PS domains are also present but no lambda/2-substructure is formed. The vertical bar chi(E)vertical bar-values of droplet surface density are reduced, as compared to homogeneous substrate, for the 3:2 blend (with vertical bar chi(E)vertical bar -> 0 for R similar to lambda). This effect is absent for the 2:3 mixture. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:1004 / 1011
页数:8
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