Test for multiple upper outliers in an exponential sample irrespective of origin

An approach for testing multiple upper outliers with slippage alternative in an exponential sample, irrespective of origin, is discussed. The outlier detection procedure is based on a ratio of two estimates, obtained by the maximization of the two log-likelihood functions. One is the complete data log-likelihood and the other is its conditional expectation, given the regular observations. The exact null distribution of the test statistic is derived and no new table for critical values is required. A simulation study is also carried out to compare the performance of the test with the earlier work.