Comparative Study on Data Error Detection Techniques in Embedded Systems

被引：0

作者：

Thati, Venu Babu ^{[1
]}

Vankeirsbilck, Jens ^{[1
]}

Boydens, Jeroen ^{[1
]}

机构：

[1] Katholieke Univ Leuven, Dept Comp Sci, Reliabil Mechatron & ICT Res Grp, Zeedijk 101, B-8400 Oostende, Belgium

来源：

2016 XXV INTERNATIONAL SCIENTIFIC CONFERENCE ELECTRONICS (ET) | 2016年

关键词：

data error detection; fault coverage; embedded systems; duplication;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a theoretical comparison of different existing data error detection techniques. The techniques are compared by fault coverage, memory overhead and performance overhead. For this comparison, ten different data error detection techniques are taken into account. In general, the best error detection technique always has the highest fault coverage with low performance and memory overhead. After performing the theoretical comparison, we conclude that GA (genetic algorithm) and SWIFT (software implemented fault tolerance) techniques are the best techniques for data error detection.

引用

页数：4

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