On the total internal reflection frustrated by a dielectric slab: Goos-Hanchen shift and deformation of the beam-wave profile

被引：0
|
作者：
Cervenova, Jozefa [1 ]
Dosoudil, Rastislav [1 ]
Franek, Jaroslav [1 ]
Sumichrast, L'ubomir [1 ]
机构：
[1] Slovak Univ Technol Bratislava, Inst Elect Engn, Ilkovicova 3, SK-81219 Bratislava, Slovakia
来源：
JOURNAL OF ELECTRICAL ENGINEERING-ELEKTROTECHNICKY CASOPIS | 2019年 / 70卷 / 02期
关键词：
electromagnetic wave; total reflection; Goos-Hanchen shift; beam-wave-profile;
D O I：
10.2478/jee-2019-0014
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The total internal reflection of a beam wave on planar dielectric boundary in presence of a nearby dielectric slab is thoroughly investigated together with its influence on the Goos-Hanchen shift and on the beam-wave-profile deformation.
引用
收藏
页码：83 / 92
页数：10
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