Development of a new measurement, system for straightness error by a heterodyne interferometer with a grating

被引:0
|
作者
Asano, S
Goto, T
Tanimura, H
Mitsui, K
机构
关键词
straightness; grating; heterodyne interferometer; machine tools; accuracy;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A new straightness error measurement optical system has been developed. This system consists of three components: (i) A He-Ne Zeeman laser, (ii) A grating secured onto a slide table and (iii) A heterodyne interferometer where a beat signal, which includes a phase shift deltaphi depending on an in-plane displacement deltax of the grating, is generated. Straightness error can be measured, because deltaphi is proportional to deltax. In this study, using this system, straightness error of a slide table is measured experimentally. Straightness error measured by this system is good agreement with one measured by a commercial laser interferometer system. The effectiveness of this system is confirmed by this result.
引用
收藏
页码:799 / 803
页数:5
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