Multilayer optical storage by low-coherence reflectometry

被引：15
|
作者：
Chinn, SR
Swanson, EA
机构：
[1] Lincoln Laboratory, Massachusetts Inst. of Technology, Lexington, MA 02173-9108
来源：
OPTICS LETTERS | 1996年 / 21卷 / 12期
关键词：
D O I：
10.1364/OL.21.000899
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We propose and analyze the use of optical coherence domain reflectometry (OCDR) in multilayer optical storage, permitting higher data density and detection sensitivity with lower interlayer cross talk and scattering. An experimental OCDR image of data on a CD-ROM is compared with an image obtained with direct detection. (C) 1996 Optical Society of America
引用
收藏
页码：899 / 901
页数：3
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