Generative software product line development using variability-aware design patterns

被引:6
|
作者
Seidl, Christoph [1 ]
Schuster, Sven [1 ]
Schaefer, Ina [1 ]
机构
[1] Tech Univ Carolo Wilhelmina Braunschweig, Braunschweig, Germany
基金
欧盟地平线“2020”;
关键词
IMPLEMENTATION; !text type='JAVA']JAVA[!/text;
D O I
10.1016/j.cl.2016.08.006
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Software Product Lines (SPLs) are an approach to reuse in-the-large that models a set of closely related software systems in terms of commonalities and variabilities. Design patterns are best practices for addressing recurring design problems in object-oriented source code. In the practice of implementing SPL, instances of certain design patterns are employed to handle variability, which makes these "variability-aware design patterns" a best practice for SPL design. However, currently there is no dedicated method for proactively developing SPLs using design patterns suitable for realizing variable functionality. In this paper, we present a method to perform generative SPL development with design patterns. We use role models to capture design patterns and their relation to a variability model. We further allow mapping of individual design pattern roles to (parts of) implementation elements to be generated (e.g., classes, methods) and check the conformance of the realization with the specification of the pattern. We provide definitions for the variability-aware versions of the design patterns Observer, Strategy, Template Method and Composite. Furthermore, we support generation of realization's in Java, C++ and UML class diagrams utilizing annotative, compositional and transformational variability realization mechanisms. Hence, we support proactive development of SPLs using design patterns to apply best practices for the realization of variability. We realize our concepts within the Eclipse IDE and demonstrate them within a case study. (C) 2016 Elsevier Ltd. All rights reserved.
引用
收藏
页码:89 / 111
页数:23
相关论文
共 50 条
  • [1] Generative Software Product Line Development using Variability-Aware Design Patterns
    Seidl, Christoph
    Schuster, Sven
    Schaefer, Ina
    [J]. SPLC'18: PROCEEDINGS OF THE 22ND INTERNATIONAL SYSTEMS AND SOFTWARE PRODUCT LINE CONFERENCE, VOL 1, 2018, : 246 - 246
  • [2] Generative Software Product Line Development using Variability-Aware Design Patterns
    Seidl, Christoph
    Schuster, Sven
    Schaefer, Ina
    [J]. ACM SIGPLAN NOTICES, 2016, 51 (03) : 151 - 160
  • [3] Generative Software Product Line Development using Variability-Aware Design Patterns
    Seidl, Christoph
    Schuster, Sven
    Schaefer, Ina
    [J]. GPCE'15: PROCEEDINGS OF THE 2015 ACM SIGPLAN INTERNATIONAL CONFERENCE ON GENERATIVE PROGRAMMING: CONCEPTS AND EXPERIENCES, 2015, : 151 - 160
  • [4] Generative software product line development using variability-aware design patterns
    Seidl, Christoph
    Schuster, Sven
    Schaefer, Ina
    [J]. ACM SIGPLAN Notices, 2015, 51 (03): : 151 - 160
  • [5] Annotative Software Product Line Analysis Using Variability-Aware Datalog
    Shahin, Ramy
    Akhundov, Murad
    Chechik, Marsha
    [J]. IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2023, 49 (03) : 1323 - 1341
  • [6] Detecting and Describing Variability-Aware Design Patterns in Feature-Oriented Software Product Lines
    Schuster, Sven
    Seidl, Christoph
    Schaefer, Ina
    [J]. PROCEEDINGS OF THE 6TH INTERNATIONAL CONFERENCE ON MODEL-DRIVEN ENGINEERING AND SOFTWARE DEVELOPMENT, 2018, : 731 - 742
  • [7] Toward variability-aware design
    Onodera, Hidetoshi
    [J]. 2007 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS, 2007, : 92 - 93
  • [8] Variability-aware design of subthreshold devices
    Jaramillo-Ramirez, Rodrigo
    Jaffari, Javid
    Anis, Mohab
    [J]. PROCEEDINGS OF 2008 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-10, 2008, : 1196 - 1199
  • [9] Variability-Aware Predictive Modeling of Line-to-Line Dielectric Reliability
    Ciofi, Ivan
    Roussel, Philippe J.
    Wilson, Christopher J.
    Croes, Kristof
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2020, 67 (04) : 1737 - 1744
  • [10] Variability-aware MMIC design through multiphysics modelling
    Guerrieri, S. Donati
    Ramella, C.
    Catoggio, E.
    Bonani, F.
    [J]. 2022 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION, NEMO, 2022,