CHARACTERIZING RANDOMLY ANISOTROPIC SURFACES IN EDDY-CURRENT NDE

被引：0
|
作者：
Sabbagh, Harold A. [1 ]
Aldrin, John C. [2 ]
Murphy, R. Kim [1 ]
Sabbagh, Elias H. [1 ]
机构：
[1] Victor Technol LLC, POB 7706, Bloomington, IN 47407 USA
[2] Computat Tools, Gurnee, IL 60031 USA
来源：
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 31A AND 31B | 2012年 / 1430卷
关键词：
Eddy-Current Nondestructive Evaluation; Random Anisotropic Media; Electromagnetic Inverse Problems; Estimation-Theoretic Metrics; CURRENT CONDUCTIVITY;
D O I：
10.1063/1.4716248
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
This research is motivated by two distinct considerations: the ability to model noise in Ti-6Al-4V, and to characterize surfaces that have undergone treatment due to shot-peening, low-plasticity burnishing, etc. We will show that with a single model we can analyze these sources of noise and develop a protocol and system requirements for detecting and inverting flaws in a random background. An important result of this study is the application of simple statistical theory toward the development of estimation-theoretic metrics.
引用
收藏
页码：340 / 347
页数：8
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