Changes of microstructure during post-deformation annealing in α-CuAl

被引：7
|
作者：
Spanl, M [1 ]
Korner, A [1 ]
Pfeiler, W [1 ]
Püschl, W [1 ]
机构：
[1] Univ Vienna, Inst Mat Phys, A-1090 Vienna, Austria
来源：
SCRIPTA MATERIALIA | 1999年 / 41卷 / 05期
基金：
奥地利科学基金会;
关键词：
D O I：
10.1016/S1359-6462(99)00181-5
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
In a preliminary study on the interaction between short-range order (SRO) and post-deformation annealing in α-CuAl samples, certain stages of defect annealing were detected. The interpretation of the microstructure of these stages as studied by TEM was attempted. Three defect annealing stages found by electrical resistivity, microhardness and DSC were interpreted as arising from the defect structure. In contrast to earlier results for α-AgZn, no development from a homogeneous dislocation distribution cells was observed. Unlike in α-AgZn, in α-CuAl, each generated subgrain seemed to grow completely independent of the annealing state of the rest of the sample.
引用
收藏
页码：505 / 510
页数：6
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