High-energy x-ray and transmission electron microscopy study of structural transformations in Ti-V -: art. no. 024204

被引:5
|
作者
Ramsteiner, IB
Schöps, A
Phillipp, F
Kelsch, M
Reichert, H
Dosch, H
Honkimäki, V
机构
[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
关键词
D O I
10.1103/PhysRevB.73.024204
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The binary system Ti-V is a paradigm for the technically important class of Ti beta alloys. In the past, it received attention as a candidate for transient ordering. We elucidate the nature of structural transformations by combining transmission electron microscopy (TEM) and a high-energy x-ray diffraction technique. The latter allows to study precipitation processes time resolved and in situ, while TEM is a powerful tool to identify individual phases. In addition to alpha-Ti precipitation we observe the formation of TiC from minor carbon impurities. Additional diffraction peaks accompanying the alpha-Ti precipitation and hinting at the existence of a B2-type superstructure are shown to originate from the precipitates. No transient ordering was found.
引用
收藏
页数:7
相关论文
共 50 条
  • [1] X-ray scattering study of temperature dependence of a structural incommensurability of the ω phase in Ti-V alloys -: art. no. 174210
    Takesue, N
    PHYSICAL REVIEW B, 2005, 72 (17)
  • [2] In situ high-energy X-ray diffraction study of the local structure of supercooled liquid Si -: art. no. 085501
    Kim, TH
    Lee, GW
    Sieve, B
    Gangopadhyay, AK
    Hyers, RW
    Rathz, TJ
    Rogers, JR
    Robinson, DS
    Kelton, KF
    Goldman, AI
    PHYSICAL REVIEW LETTERS, 2005, 95 (08)
  • [3] High-resolution x-ray diffraction and transmission electron microscopy of multiferroic BiFeO3 films -: art. no. 071913
    Qi, XD
    Wei, M
    Lin, Y
    Jia, QX
    Zhi, D
    Dho, J
    Blamire, MG
    MacManus-Driscoll, JL
    APPLIED PHYSICS LETTERS, 2005, 86 (07) : 1 - 3
  • [4] Characterization of Amorphized Zeolite A by Combining High-Energy X-ray Diffraction and High-Resolution Transmission Electron Microscopy
    Sato, Kaku
    Wakihara, Toru
    Kohara, Shinji
    Ohara, Koji
    Tatami, Junichi
    Endo, Akira
    Inagaki, Satoshi
    Kawamura, Izuru
    Naito, Akira
    Kubota, Yoshihiro
    JOURNAL OF PHYSICAL CHEMISTRY C, 2012, 116 (48): : 25293 - 25299
  • [5] HIGH-ENERGY X-RAY MICROSCOPY WITH MULTILAYER REFLECTORS
    UNDERWOOD, JH
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08): : 2119 - 2123
  • [6] Energy dispersive X-ray microanalysis in transmission electron microscopy
    Armigliato, A
    EDXRS-98: PROCEEDINGS OF THE EUROPEAN CONFERENCE ON ENERGY DISPERSIVE X-RAY SPECTROMETRY 1998, 1999, : 173 - 177
  • [7] A SYSTEMATIC STUDY OF THE ABUTMENT OF HIGH-ENERGY X-RAY AND ELECTRON FIELDS
    HARMS, WB
    PURDY, JA
    MEDICAL PHYSICS, 1984, 11 (03) : 370 - 370
  • [8] Electron disequilibrium in high-energy x-ray beams
    Hannallah, D
    Zhu, TC
    Bjarngard, BE
    MEDICAL PHYSICS, 1996, 23 (11) : 1867 - 1871
  • [9] ELECTRON CONTAMINATION OF A HIGH-ENERGY X-RAY BEAM
    PADIKAL, TN
    DEYE, JA
    PHYSICS IN MEDICINE AND BIOLOGY, 1978, 23 (06): : 1086 - 1092
  • [10] Temporal characterization of ultrashort x-ray pulses using x-ray anomalous transmission -: art. no. 061803
    Nazarkin, A
    Morak, A
    Uschmann, I
    Förster, E
    Sauerbrey, R
    PHYSICAL REVIEW A, 2004, 69 (06) : 061803 - 1