X-ray photoemission electron microscopy: Magnetic circular dichroism imaging and other contrast mechanisms

The x-ray photoemission electron microscope (X-PEEM) is a type of spectromicroscope, which can make spatial maps of chemical composition. The contrast in the images can originate from a number of properties of the sample, and by controlling the way the XPEEM is used a number of different types of information about the surface can be revealed. These contrast mechanisms include topography, band-gap, work function, chemical composition, crystalline orientation, adsorbate reactants, and magnetic domains. Some recent results are described.