In situ structural studies on orthorhombic SnS micro-crystals

被引:12
|
作者
Reddy, N. Koteeswara [1 ]
Devika, M. [2 ]
Prashantha, M. [3 ]
Ramesh, K. [3 ]
Gunasekhar, K. R. [4 ]
机构
[1] Indian Inst Sci, Ctr Nanosci & Engn, Bangalore 560012, Karnataka, India
[2] Indian Inst Sci, Dept Aerosp Engn, Bangalore 560012, Karnataka, India
[3] Indian Inst Sci, Dept Phys, Bangalore 560012, Karnataka, India
[4] Indian Inst Sci, Dept Instrumentat & Appl Phys, Bangalore 560012, Karnataka, India
来源
关键词
SULFIDE THIN-FILMS; TIN SULFIDE; OPTICAL-PROPERTIES; SINGLE-CRYSTALS; PHYSICAL-PROPERTIES; BAND-STRUCTURE; SPECTRA; ELECTRODEPOSITION; FABRICATION; DEPOSITION;
D O I
10.1051/epjap/2012120259
中图分类号
O59 [应用物理学];
学科分类号
摘要
In situ powder X-ray diffraction (XRD) studies on 3D micro-crystalline tin (II) sulfide (SnS) were carried out at different temperatures. While increasing temperature, the crystal structure of SnS remains stable as orthorhombic, whereas its lattice parameters and unit-cell volume are considerably varied. Further, these 3D micro-crystalline structures have showed a negative thermal expansion along the a-axis and positive expansion along the b- and c-axes. However, the overall drop along the a-axis of SnS crystals is nearly equal to their expansion along the c-axis. The observed changes in the structural properties of SnS micro-crystallites with temperature are discussed and reported.
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页数:6
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