APMP comparison of measurement of surface emission rate of 36Cl large area source (APMP.RI(II)-K2.Cl-36)

被引:2
|
作者
Yunoki, Akira [1 ]
Hino, Yoshio [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Natl Metrol Inst Japan, Tsukuba, Ibaraki 3058568, Japan
关键词
Large area source; Surface emission rate; Cl-36; International comparison; Surface contamination; SYSTEM; ALPHA;
D O I
10.1016/j.apradiso.2012.02.034
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
An international comparison of measurement of beta particle surface emission rate from a Cl-36 large area source (APMP.RI(II)-S1.Cl-36) was carried out within the framework of the Asia-Pacific Metrology Program (APMP). Participants from APMP were NMIJ (Japan), KRISS (Korea) and INER (Chinese Taipei). Participants from the other RMOs were NIST (United States), PTB (Germany), NMISA (South Africa) and VNIIM (Russia). All the results of the participants agreed within +/- 1%. This was the first international comparison of measurement of surface emission rate of beta particle from a large area source. (c) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1831 / 1835
页数:5
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