CMOS SPADs Selection, Modeling and Characterization Towards Image Sensors Implementation

被引：0
|
作者：
Moreno Garcia, Manuel [1 ]
Guerra Vinuesa, Oscar [1 ]
del Rio Fernandez, Rocio [1 ]
Perez Verdu, Belen [1 ]
Rodriguez Vazquez, Angel [1 ]
机构：
[1] Univ Seville, CSIC, CNM, IMSE,Inst Microelect Sevilla, C Amer Vespucio S-N, Seville 41092, Spain
来源：
2012 19TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS (ICECS) | 2012年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The selection, modeling and characterization of Single Photon Avalanche Diodes (SPADs) are presented. Working with the standard 180nm UMC CMOS process, different SPAD structures are proposed in combination with several quenching circuits in order to compare their relative performances. Various configurations for the active region and the prevention of the premature edge breakdown are tested, looking for a miniaturization of the devices to implement image sensor arrays without loses in their performance.
引用
收藏
页码：332 / 335
页数：4
相关论文
共 50 条
  • [1] Characterization and Modeling of Breakdown Probability in Sub-Micrometer CMOS SPADs
    Pancheri, Lucio
    Stoppa, David
    Betta, Gian-Franco Dalla
    [J]. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2014, 20 (06) : 328 - 335
  • [2] Characterization of CMOS photodiodes for image sensors
    Brouk, I
    Ezion, A
    Nemirovsky, Y
    [J]. ELECTRO-OPTICS AND MICROELECTRONICS, PROCEEDINGS, 2000, 14 : 225 - 227
  • [3] Characterization-Based Modeling of Retriggering and Afterpulsing for Passively Quenched CMOS SPADs
    Moreno-Garcia, Manuel
    Pancheri, Lucio
    Perenzonr, Matteo
    del Rio, Rocio
    Guerra Vinuesa, Oscar
    Rodriguez-Vazquez, Angel
    [J]. IEEE SENSORS JOURNAL, 2019, 19 (14) : 5700 - 5709
  • [4] Modeling and Simulation of TDI CMOS Image Sensors
    Nie Kai-ming
    Yao Su-ying
    Xu Jiang-tao
    Gao Jing
    [J]. INTERNATIONAL SYMPOSIUM ON PHOTOELECTRONIC DETECTION AND IMAGING 2013: INFRARED IMAGING AND APPLICATIONS, 2013, 8907
  • [5] Design and characterization of CMOS/SOI image sensors
    Brouk, Igor
    Alameh, Kamal
    Nemirovsky, Yael
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2007, 54 (03) : 468 - 475
  • [6] Characterization of "blinking pixels" in CMOS image sensors
    Ackerson, Kristin
    Musante, Charles
    Gambino, Jeffrey
    Ellis-Monaghan, John
    Maynard, Daniel
    Rassel, Richard J.
    Ogg, Kevin
    Jaffe, Mark
    [J]. 2008 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE, 2008, : 255 - 258
  • [7] Leakage current modeling of test structures for characterization of dark current in CMOS image sensors
    Loukianova, NV
    Folkerts, HO
    Maas, JPV
    Verbugt, DWE
    Mierop, AJ
    Hoekstra, W
    Roks, E
    Theuwissen, AJP
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2003, 50 (01) : 77 - 83
  • [8] Modeling and estimation of FPN components in CMOS image sensors
    El Gamal, A
    Fowler, B
    Min, H
    Liu, XQ
    [J]. SOLID STATE SENSOR ARRAYS: DEVELOPMENT AND APPLICATIONS II, 1998, 3301 : 168 - 177
  • [9] Characterization and deblurring of lateral crosstalk in CMOS image sensors
    Lee, JS
    Shah, J
    Jernigan, ME
    Hornsey, RI
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2003, 50 (12) : 2361 - 2368
  • [10] CMOS image sensors
    El Gamal, A
    Eltoukhy, H
    [J]. IEEE CIRCUITS & DEVICES, 2005, 21 (03): : 6 - 20
12345