Study on Near-field scattering characteristic based on Ray-tracing

被引：0
|
作者：
Wu Kaifeng [1 ]
Ma Jing [1 ]
Mao Hongxia [1 ]
Dong Yanbing [1 ]
机构：
[1] Sci & Technol Opt Radiat Lab, Beijing 100854, Peoples R China
来源：
6TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT | 2012年 / 8417卷
关键词：
ray-tracing; scattering-characteristic; CUDA;
D O I：
10.1117/12.977637
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A new arithmetic is put forward for calculating near-field scattering, which based on ray-tracing. Detailedly, targets is modeled by elementary volume elements, each contains the spectrum scattering coefficients(BRDF). When the distance between the targets and the detector changes, the light source is simulated as a spot source or surface source. In ray tracing, KD-TREE is used and adopted the CUDA multithreading programming arithmetic, which enable to tackle huge quantities of rays in complex geometric environment. The test result proves the practicability of the method.
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页数：5
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