The effect of X-ray photoelectron spectroscopy measurement on P(VDF-TrFE) copolymer thin films

被引：12
|
作者：
Mandal, Dipankar [1 ,2 ]
Mueller, Klaus [2 ]
Henkel, Karsten [2 ]
Schmeisser, Dieter [2 ]
机构：
[1] Jadavpur Univ, Dept Phys, Kolkata 700032, India
[2] Brandenburg Tech Univ Cottbus, D-03046 Cottbus, Germany
来源：
APPLIED SURFACE SCIENCE | 2012年 / 261卷
关键词：
P(VDF-TrFE) copolymer thin film; XPS measurement; X-ray irradiation; Ferroelectric to paraelectric phase transformation; FERROELECTRIC PHASE-TRANSITION; POLY(VINYLIDENE FLUORIDE); POLYVINYLIDENE FLUORIDE; ALUMINUM;
D O I：
10.1016/j.apsusc.2012.07.144
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The impact of prolonged X-ray irradiation during X-ray photoelectron spectroscopy (XPS) measurement was investigated on poly(vinylidene-trifluoroethylene) (P(VDF-TrFE)) thin films. It was observed that prolonged X-ray irradiation can accelerate the crosslinking of P(VDF-TrFE) and diminish the ferroelectric phase. Fourier transform infrared spectroscopy (FT-IR) data indicate that the ferroelectric phase diminishes completely after 360 kJ of X-ray irradiation dose and it induces the paraelectric phase. In this work, the main emphasis was given to the optimization of the X-ray irradiation dose during XPS measurements to maintain the ferroelectric phase within the copolymer films. (C) 2012 Elsevier B. V. All rights reserved.
引用
收藏
页码：209 / 213
页数：5
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