The influence of pH on friction between oxide surfaces in electrolytes, studied with lateral force microscopy: application as a nanochemical imaging technique

被引:29
|
作者
Haehner, Georg [1 ]
Marti, Andreas [1 ]
Spencer, Nicholas D. [1 ]
机构
[1] ETH, Dept Mat, ETH Zentrum, Lab Surface Sci & Technol, CH-8092 Zurich, Switzerland
关键词
AFM/LFM; lateral force (friction) signal; oxide (amphoteric) surfaces; pH; nanochemical imaging;
D O I
10.1023/A:1019153726944
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
We have investigated the lateral force (frictional) signal between the Si(3)N(4) tip of an AFM and SiO(2) and AlO(x) surfaces in a 1 mM NaCl solution, as a function of pH. It was found that the frictional force depends strongly on both the pH and the isoelectric points (IEP) of the materials under investigation. A simple linear model describing the dependence of the lateral force on the total normal force has been used to account qualitatively for the observed lateral force signal from the single-asperity contact between tip and surface on a nanometer scale. The observed pH-dependence of the lateral force signal on different oxide surfaces has been applied to reverse the chemical contrast on an appropriate sample composed of two different oxides, thus demonstrating the potential of this method for "chemical imaging".
引用
收藏
页码:359 / 365
页数:7
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