Application of direct methods for crystal structure determination using strongly dynamical bulk electron diffraction

被引:2
|
作者
Sinkler, W [1 ]
Marks, LD [1 ]
机构
[1] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
基金
美国国家科学基金会;
关键词
D O I
10.1016/S1044-5803(99)00021-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In recent work it was shown that dynamical diffraction effects on direct methods calculations can be taken into account, and that the effect of dynamical scattering is an approximate reconstruction of \1 - Psi(r) \, where Psi(r) is the complex electron exit wave. The present work examines these approximations in more detail using the channeling theory and empirical examples. Despite a dependence on thickness and structure in the general case, the approximations are well justified for structures that consist of well-defined atomic columns along the beam direction. An overview of the present minimum relative entropy direct methods algorithm is presented. (C) Elsevier Science Inc., 1999. All rights reserved.
引用
收藏
页码:283 / 295
页数:13
相关论文
共 50 条
  • [1] Application of direct methods to dynamical electron diffraction data for solving bulk crystal structures
    Sinkler, W
    Bengu, E
    Marks, LD
    ACTA CRYSTALLOGRAPHICA SECTION A, 1998, 54 : 591 - 605
  • [2] Application of direct methods to dynamical electron diffraction data for solving bulk crystal structures
    Sinkler, W.
    Bengu, E.
    Marks, L.D.
    Acta Crystallographica, Section A: Foundations of Crystallography, 1998, 54 (pt 5):
  • [3] BULK STRUCTURES USING DYNAMICAL DIRECT METHODS
    Marks, L. D.
    Sinkler, W.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 144 - 144
  • [4] CRYSTAL STRUCTURE DETERMINATION BY ELECTRON DIFFRACTION
    COWLEY, JM
    PROGRESS IN MATERIALS SCIENCE, 1967, 13 (06) : 269 - &
  • [5] Direct methods for adsorbate structure determination using photoelectron diffraction
    Schaff, O
    Hofmann, P
    Hirschmugl, CJ
    Theobald, A
    Fernandez, V
    Schindler, KM
    Bradshaw, AM
    Booth, N
    Davis, R
    Woodruff, DP
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1995, 76 : 85 - 90
  • [6] Quantitative Electron Diffraction for Crystal Structure Determination
    Oleynikov, Peter
    Gruner, Daniel
    Zhang, Daliang
    Sun, Junliang
    Zou, Xiaodong
    Hovmoller, Sven
    ELECTRON CRYSTALLOGRAPHY FOR MATERIALS RESEARCH AND QUANTITATIVE CHARACTERIZATION OF NANOSTRUCTURED MATERIALS, 2009, 1184 : 3 - 9
  • [7] DETERMINATION OF CRYSTAL STRUCTURE BY OPTICAL DIFFRACTION METHODS
    HANSON, AW
    TAYLOR, CA
    LIPSON, H
    NATURE, 1952, 169 (4313) : 1086 - 1086
  • [8] Crystal structure determination using automated electron diffraction tomography.
    Oleynikov, Peter
    Ma, Yanhang
    Yoon, Kyung Byung
    Terasaki, Osamu
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2012, 68 : S59 - S59
  • [9] Direct inversion of dynamical electron diffraction patterns to structure factors
    Spence, JCH
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1998, 54 : 7 - 18
  • [10] Direct inversion of dynamical electron diffraction patterns to structure factors
    Acta Crystallogr Sect A Found Crystallogr, pt 1 (07):