Dependence of field-effect mobility and contact resistance on nanostructure in regioregular poly(3-hexylthiophene) thin film transistors

被引:31
|
作者
Singh, K. A. [1 ]
Sauve, G. [2 ]
Zhang, R. [2 ]
Kowalewski, T. [2 ]
McCullough, R. D. [2 ]
Porter, L. M. [1 ]
机构
[1] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA
[2] Carnegie Mellon Univ, Dept Chem, Pittsburgh, PA 15213 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2955515
中图分类号
O59 [应用物理学];
学科分类号
摘要
The mobility and contact resistance of transistors based on regioregular poly(3-hexylthiophene) (P3HT) with Ti/Pt electrodes were investigated as a function of the molecular weight (M-W) of P3HT. For an increase in M-W from 5.5 to 11 kDa, the mobility increased from 0.04 to 0.16 cm(2) V-1 s(-1), whereas the contact resistance decreased from 1.7 to 0.6 M Omega. Further increases in M-W yielded an apparent saturation in both the mobility and the contact resistance. A nanofibrilar morphology was observed where the width of the nanofibrils increases with M-W. A qualitative model based on polymer chain folding is proposed to explain the electrical results. (c) 2008 American Institute of Physics.
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页数:3
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