Two-dimensional spectral shearing interferometry for few-cycle pulse characterization

被引：118
|
作者：
Birge, Jonathan R. [1 ]
Ell, Richard [1 ]
Kartner, Franz X. [1 ]
机构：
[1] MIT, Dept Elect Engn & Comp Sci, Cambridge, MA 02139 USA
来源：
OPTICS LETTERS | 2006年 / 31卷 / 13期
关键词：
D O I：
10.1364/OL.31.002063
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a new method for measuring the spectral phase of ultrashort pulses that utilizes spectral shearing interferometry with zero delay. Unlike conventional spectral phase interferometry for direct electric-field reconstruction, which encodes phase as a sensitively calibrated fringe in the spectral domain, two-dimensional spectral shearing interferometry robustly encodes phase along a second dimension. This greatly reduces demands on the spectrometer and allows for complex phase spectra to be measured over extremely large bandwidths, potentially exceeding 1.5 octaves. (c) 2006 Optical Society of America.
引用
收藏
页码：2063 / 2065
页数：3
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